SanDisk MicroSD Cards Fail Early in Extensive Data Writing Test

A rigorous three-year endurance test involving 351 MicroSD cards has revealed significant durability issues with SanDisk cards, which experienced the highest failure rate among the tested brands. The experiment subjected cards to continuous data writing until they failed, accumulating a total of 133 petabytes of data across all devices.

While most cards eventually succumbed to the extreme workload, SanDisk's performance stood out negatively, with seven of its cards failing during the test. This finding is particularly noteworthy given the widespread use of MicroSD cards for data storage and transfer, raising questions about the reliability of certain models under sustained heavy usage.